Matching Criteria in Fractal Image Compression, Midwest Symposium on Circuits and Systems, 2000
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Reference Type:
Conference Paper
External Authors:
El-Sherif, M., S., El Sayad, A.,
Conference name :
Proceedings of the 43rd IEEE, East Lansing, Michigan
Conference Location:
USA
Date:
Aug. 8th-11th, 2000
